ROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of groundbreaking process control metrology solutions for advanced semiconductor devices, today ...
ROTTERDAM, The Netherlands, Nov. 18, 2025 (GLOBE NEWSWIRE) -- Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today ...
Zeta Instruments, Inc., announced today that a leading Taiwan based outsourced semiconductor assembly and test (OSAT) ordered its third Zeta-580™ automated metrology system for production monitoring ...
MANHASSET, N.Y. — KLA-Tencor Corp. (San Jose) has signed a definitive agreement to acquire Candela Instruments, a supplier of laser-based surface inspection systems optimized for the data storage ...
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