insights from industryArash MirhamedLead of ISE Support TeamPark Systems In this interview, Arash Mirhamed, lead of the ISE Support Team at Park Systems, explores how imaging spectroscopic ...

Come learn how to collect measurements on the instrument. Involves hands-on practice of sample alignment and data collection. Due to limited space in the cleanroom, there are only 10 spots available ...

Recently, a research group led by Prof. Gao Xiaoming and Prof. Liu Kun from Hefei Institutes of Physical Science (HFIPS), Chinese Academy of Sciences (CAS), developed a concentration-independent ...

Any good club fitting should begin with conversation. Before a single club is pulled from the rack or a ball is struck, the fitter needs context. How has your golf been lately? How does your current ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

Ellipsometry and reflectometry are optical measurement techniques used for surface analysis and thin-film characterization. 1 Both methods rely on light reflection but differ in their approach.

Messenger ribonucleic acid (mRNA) is a single-stranded molecule of RNA that carries the instructions from DNA to create specific proteins. The main applications for mRNA include immunotherapy, protein ...